{
    "url": "https://chloe.cnr.it/s/DHeLO/item/14957",
    "o:resource_class": "fabio:ConferencePaper",
    "dcterms:creator": [
        "Gatto, Carola",
        "Calabrese, Lucia",
        "Chiarella, Salvatore",
        "De Luca, Valerio",
        "D’Errico, Giovanni",
        "Nuzzo, Benito",
        "Raffone, Antonino",
        "De Paolis, Lucio Thomas"
    ],
    "dcterms:date": [
        "2022"
    ],
    "dcterms:language": [
        "eng"
    ],
    "dcterms:isPartOf": [
        "2022 IEEE International Conference on Metrology for Extended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE)"
    ],
    "bibo:doi": [
        "https://doi.org/10.1109/MetroXRAINE54828.2022.9967568"
    ],
    "bibo:pages": [
        "483-488"
    ],
    "foaf:homepage": [
        "https://www.zotero.org/groups/5293298/bidiar/items/332ZP73G/item-list"
    ]
},