Structure-from-Motion (SFM) Photogrammetry as a Non-Invasive Methodology to Digitalize Historical Documents: A Highly Flexible and Low-Cost Approach?

Title: Structure-from-Motion (SFM) Photogrammetry as a Non-Invasive Methodology to Digitalize Historical Documents: A Highly Flexible and Low-Cost Approach?
Creator(s): Brandolini, Filippo; Patrucco, Giacomo
Date: 2019
Is Part Of: Heritage
Volume: 2
Issue: 3
Pages: 2124-2136
Language: eng
Rights: http://creativecommons.org/licenses/by/3.0/
ISSN: 2571-9408
Short Title: Structure-from-Motion (SFM) Photogrammetry as a Non-Invasive Methodology to Digitalize Historical Documents
DOI: https://doi.org/10.3390/heritage2030128
URI: https://www.mdpi.com/2571-9408/2/3/128
Zotero BiDiAr: https://www.zotero.org/groups/5293298/bidiar/items/RAV4FFVX/item-list
Abstract: Historical documents represent a significant part of the world cultural heritage and need to be preserved from physical deformation due to ageing. The restoration of fragile documents requires economic resources that are often limited to only preserve the integrity of exceptional and highly valuable historical records. On the other hand, regeneration of ancient documents in digital form is a useful way to preserve them regardless of the material they are made of. In addition, the digitization of historical cartography allows creating a valuable dataset for a variety of GIS applications as well as spatial and landscape studies. Nonetheless, historical maps are usually deformed, and a contact-scanning process could damage them because this method requires planar positioning of the map. In this regard, photogrammetry has been used successfully as a non-invasive method to digitize historical documentation. The purpose of this research is to assess a low-cost and highly flexible strategy to digitize historical maps and documents through digital photogrammetry using low-cost commercial off-the-shelf sensors. This methodology allows training a wider audience of cultural heritage operators in digitizing historic records with a millimeter-level accuracy.